Figure 2: Part of an electron diffraction pattern after background subtraction of a CdS nanocrystal of 7 nm in diameter in the [112] cubic orientation. Figure 3: Sub-ångström imaging of a CdS quantum ...
The authors discuss the valuable information that can be obtained from indexing and its applications in routine screening and analysis of solid forms. Crystal-structure determination using X-ray ...
In the field of scanning electron microscopy (SEM), the electron backscatter diffraction (EBSD) method has developed into a robust tool for the crystallographic analysis of materials. Specifically, ...
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