A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
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Greenwood High alumni win top prize at Purdue AI showcase
Two alumni of Greenwood High International School have secured first place in the poster competition at Purdue University's ...
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